From 631182fb770e05649ba9ccce3e9e22bebc90c114 Mon Sep 17 00:00:00 2001 From: Jack Grigg Date: Tue, 28 Sep 2021 21:49:06 +0100 Subject: [PATCH] Update selector columns in expected-failure tests The addition of the non-identity selector caused the layouter to reorder some of the selectors in the ECC gadget test circuit. --- src/circuit/gadget/ecc/chip/mul_fixed/short.rs | 6 +++--- 1 file changed, 3 insertions(+), 3 deletions(-) diff --git a/src/circuit/gadget/ecc/chip/mul_fixed/short.rs b/src/circuit/gadget/ecc/chip/mul_fixed/short.rs index cf7e756e..ac22756b 100644 --- a/src/circuit/gadget/ecc/chip/mul_fixed/short.rs +++ b/src/circuit/gadget/ecc/chip/mul_fixed/short.rs @@ -505,7 +505,7 @@ pub mod tests { Err(vec![ VerifyFailure::ConstraintNotSatisfied { constraint: ( - (16, "Short fixed-base mul gate").into(), + (17, "Short fixed-base mul gate").into(), 0, "last_window_check" ) @@ -537,13 +537,13 @@ pub mod tests { prover.verify(), Err(vec![ VerifyFailure::ConstraintNotSatisfied { - constraint: ((16, "Short fixed-base mul gate").into(), 1, "sign_check") + constraint: ((17, "Short fixed-base mul gate").into(), 1, "sign_check") .into(), row: 26 }, VerifyFailure::ConstraintNotSatisfied { constraint: ( - (16, "Short fixed-base mul gate").into(), + (17, "Short fixed-base mul gate").into(), 3, "negation_check" )