SDIO. Added some additional debug output in testhal.

git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@4253 35acf78f-673a-0410-8e92-d51de3d6d3f4
This commit is contained in:
barthess 2012-06-01 19:46:22 +00:00
parent d406f96c22
commit daf9d3018d
1 changed files with 7 additions and 2 deletions

View File

@ -27,7 +27,7 @@
#include "ff.h"
#define SDC_DATA_DESTRUCTIVE_TEST TRUE
#define SDC_DATA_DESTRUCTIVE_TEST FALSE
#define SDC_BURST_SIZE 8 /* how many sectors reads at once */
static uint8_t outbuf[MMCSD_BLOCK_SIZE * SDC_BURST_SIZE + 1];
@ -131,7 +131,12 @@ void cmd_sdiotest(BaseSequentialStream *chp, int argc, char *argv[]){
if (!sdcConnect(&SDCD1)) {
chprintf(chp, "OK\r\nSingle aligned read...");
chprintf(chp, "OK\r\n");
chprintf(chp, "*** Card CSD content is: ");
chprintf(chp, "%X %X %X %X \r\n", (&SDCD1)->csd[3], (&SDCD1)->csd[2],
(&SDCD1)->csd[1], (&SDCD1)->csd[0]);
chprintf(chp, "Single aligned read...");
chThdSleepMilliseconds(100);
if (sdcRead(&SDCD1, 0, inbuf, 1))
chSysHalt();