ChibiOS/testhal/STM32/STM32F7xx/IRQ_STORM
Giovanni Di Sirio 4972de4967 Documentation-related fixes.
git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@8676 35acf78f-673a-0410-8e92-d51de3d6d3f4
2016-01-03 11:13:25 +00:00
..
debug Fixed bug #675. 2015-11-29 09:56:02 +00:00
.cproject
.project
Makefile IRQ Storm for STM32F7. 2015-11-29 08:20:40 +00:00
chconf.h IRQ Storm for STM32F7. 2015-11-29 08:20:40 +00:00
halconf.h Documentation-related fixes. 2016-01-03 11:13:25 +00:00
main.c IRQ Storm for STM32F7. 2015-11-29 08:20:40 +00:00
mcuconf.h Mass update of mcuconf.h, added WDG. 2015-12-04 12:39:38 +00:00
readme.txt

readme.txt

*****************************************************************************
** ChibiOS/HAL - IRQ_STORM stress test demo for STM32F4xx.                 **
*****************************************************************************

** TARGET **

The demo runs on an STMicroelectronics STM32F4-Discovery board.

** The Demo **

The application demonstrates the use of the STM32F4xx GPT, PAL and Serial
drivers in order to implement a system stress demo.

** Board Setup **

None.

** Build Procedure **

The demo has been tested using the free Codesourcery GCC-based toolchain
and YAGARTO.
Just modify the TRGT line in the makefile in order to use different GCC ports.

** Notes **

Some files used by the demo are not part of ChibiOS/RT but are copyright of
ST Microelectronics and are licensed under a different license.
Also note that not all the files present in the ST library are distributed
with ChibiOS/RT, you can find the whole library on the ST web site:

                             http://www.st.com