SD-card log fields improvement (warning counter & last code) #3162
This commit is contained in:
parent
5afda5f2cc
commit
8c5dab5bd6
|
@ -202,8 +202,8 @@ struct TunerStudioOutputChannels {
|
|||
// Errors
|
||||
scaled_channel<uint32_t> totalTriggerErrorCounter; // 140
|
||||
int orderingErrorCounter; // 144
|
||||
int16_t warningCounter; // 148
|
||||
int16_t lastErrorCode; // 150
|
||||
scaled_channel<uint16_t> warningCounter; // 148
|
||||
scaled_channel<uint16_t> lastErrorCode; // 150
|
||||
int16_t recentErrorCodes[8]; // 152-166
|
||||
|
||||
// Debug
|
||||
|
@ -214,9 +214,9 @@ struct TunerStudioOutputChannels {
|
|||
float debugFloatField5;
|
||||
float debugFloatField6;
|
||||
float debugFloatField7;
|
||||
int debugIntField1;
|
||||
int debugIntField2;
|
||||
int debugIntField3;
|
||||
scaled_channel<uint32_t> debugIntField1;
|
||||
scaled_channel<uint32_t> debugIntField2;
|
||||
scaled_channel<uint32_t> debugIntField3;
|
||||
int16_t debugIntField4;
|
||||
int16_t debugIntField5; // 210
|
||||
|
||||
|
|
|
@ -239,7 +239,7 @@ void stopLogicAnalyzerPins() {
|
|||
}
|
||||
}
|
||||
|
||||
void getChannelFreqAndDuty(int index, float *duty, int *freq) {
|
||||
static void getChannelFreqAndDuty(int index, float *duty, scaled_channel<uint32_t> *freq) {
|
||||
|
||||
float high,period;
|
||||
|
||||
|
@ -268,12 +268,12 @@ void getChannelFreqAndDuty(int index, float *duty, int *freq) {
|
|||
|
||||
void reportLogicAnalyzerToTS() {
|
||||
#if EFI_TUNER_STUDIO
|
||||
int tmp;
|
||||
scaled_channel<uint32_t> tmp;
|
||||
getChannelFreqAndDuty(0,&tsOutputChannels.debugFloatField1, &tsOutputChannels.debugIntField1);
|
||||
getChannelFreqAndDuty(1,&tsOutputChannels.debugFloatField2, &tsOutputChannels.debugIntField2);
|
||||
getChannelFreqAndDuty(2,&tsOutputChannels.debugFloatField3, &tsOutputChannels.debugIntField3);
|
||||
getChannelFreqAndDuty(3,&tsOutputChannels.debugFloatField4, &tmp);
|
||||
tsOutputChannels.debugIntField4 = (int16_t)tmp;
|
||||
tsOutputChannels.debugIntField4 = tmp;
|
||||
#endif
|
||||
}
|
||||
|
||||
|
|
Loading…
Reference in New Issue