* add redundant sensor
* add tests
* add configure, info printing
* tests
* tests
* partial hookup
* fix
* fix
* bad makefile merge
* use second TPS config
* update test
* update test
* sensor names
* set second pin by default
* fix auto cal
* auto cal both sensors
* add reconfigure of secondary sensors
* gobblin' up your ram
* slow down write a little bit
* put split in debug gauge
* s
Co-authored-by: Matthew Kennedy <matthew@mck-mbp-15.local>
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>
* field support
* tests
* makefiles
* test data too
* missing include dir
* write correct thing
* fix one test
* fix test
* omnomnomnom ram
* format
* use defined names
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>
* switch to thread
* actually use default frequency define
* crank ADC too
* make space in RAM
* remove TS field
* this should work for test
* auto cal
* wire up bench testing
* s
* fix
* rearrange a bit
* inject
* remove unused bit
* mock repair
* guard for ECUs without ETB
* switch to thread
* actually use default frequency define
* crank ADC too
* make space in RAM
* remove TS field
* this should work for test
* fix dt
* re-resize ram
* add clampf
* more tests
* public
* missed a mock
* fix output duty clamping
* do it that way
* more
* ah ha!
* test negative too
* clamp pedal
* inject pedal map
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>
* add clampf
* more tests
* public
* missed a mock
* fix output duty clamping
* do it that way
* more
* ah ha!
* test negative too
* clamp pedal
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>
* closed loop controller base
* etb tps test
* closed loop controller tests
* test support
* update gtest
* fix for change
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>
* use type instead of value
* fix remaining initializer-list users
* impruv
* last consumer?
* consumer
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>
* hook up clt
* init test
* probably fix test
* aux temp
* relax checking
* more significant figures
* remove old aux temp
* hand generate
* claim RAM
* move to ccm
* subscribe
* info printing
* warnings
* raise high voltage failure threshold
* fix test
Co-authored-by: Matthew Kennedy <makenne@microsoft.com>