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Memtest improvements

This commit is contained in:
barthess 2015-08-04 00:35:44 +03:00
parent cabe3aafad
commit 8c8c0a0be4
2 changed files with 29 additions and 7 deletions
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13
os/various/memtest.cpp
View File

@ -20,6 +20,8 @@
#include "memtest.hpp" #include "memtest.hpp"
static unsigned int prng_seed = 42;
/* /*
* *
*/ */
@ -156,6 +158,8 @@ static void memtest_sequential(memtest_t *testp, Generator<T> &generator, T seed
const size_t steps = testp->size / sizeof(T); const size_t steps = testp->size / sizeof(T);
size_t i; size_t i;
T *mem = static_cast<T *>(testp->start); T *mem = static_cast<T *>(testp->start);
T got;
T expect;
/* fill ram */ /* fill ram */
generator.init(seed); generator.init(seed);
@ -165,8 +169,10 @@ static void memtest_sequential(memtest_t *testp, Generator<T> &generator, T seed
/* read back and compare */ /* read back and compare */
generator.init(seed); generator.init(seed);
for (i=0; i<steps; i++) { for (i=0; i<steps; i++) {
if (mem[i] != generator.get()) { got = mem[i];
testp->ecb(testp, generator.get_type(), i*sizeof(T)); expect = generator.get();
if ((got != expect) && (nullptr != testp->errcb)) {
testp->errcb(testp, generator.get_type(), i, sizeof(T), got, expect);
return; return;
} }
} }
@ -210,7 +216,8 @@ template <typename T>
static void moving_inversion_rand(memtest_t *testp) { static void moving_inversion_rand(memtest_t *testp) {
GeneratorMovingInvRand<T> generator; GeneratorMovingInvRand<T> generator;
T mask = -1; T mask = -1;
memtest_sequential<T>(testp, generator, testp->rand_seed & mask); prng_seed++;
memtest_sequential<T>(testp, generator, prng_seed & mask);
} }
/* /*

23
os/various/memtest.hpp
View File

@ -37,7 +37,8 @@ typedef uint32_t testtype;
/* /*
* Error call back. * Error call back.
*/ */
typedef void (*memtestecb_t)(memtest_t *testp, testtype type, size_t address); typedef void (*memtestecb_t)(memtest_t *testp, testtype type, size_t offset,
size_t current_width, uint32_t got, uint32_t expect);
/* /*
* *
@ -45,18 +46,32 @@ typedef void (*memtestecb_t)(memtest_t *testp, testtype type, size_t address);
typedef enum { typedef enum {
MEMTEST_WIDTH_8, MEMTEST_WIDTH_8,
MEMTEST_WIDTH_16, MEMTEST_WIDTH_16,
MEMTEST_WIDTH_32 MEMTEST_WIDTH_32,
} memtest_bus_width_t; } memtest_bus_width_t;
/* /*
* *
*/ */
struct memtest_t { struct memtest_t {
/*
* Pointer to the test area start. Must be word aligned.
*/
void *start; void *start;
/*
* Test area size in bytes.
*/
size_t size; size_t size;
/*
* Maximum width of transactions.
* Note: it implies all narrower tests.
* Note: width my be wider then your memory interface because AHB is
* smart enough to split big transactions to smaller ones.
*/
memtest_bus_width_t width; memtest_bus_width_t width;
memtestecb_t ecb; /*
unsigned int rand_seed; * Error callback pointer. Set to NULL if unused.
*/
memtestecb_t errcb;
}; };
/* /*