ChibiOS/testhal/STM32/STM32F0xx/IRQ_STORM
Giovanni Di Sirio bbacae2118 Aligned mcuconf.h files for STM32F0xx devices. Removed obsolete settings, added DMA remapping settings.
git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@8125 35acf78f-673a-0410-8e92-d51de3d6d3f4
2015-07-29 08:59:55 +00:00
..
debug All IRQ_STORM applications reworked. 2015-04-11 18:08:14 +00:00
.cproject All IRQ_STORM applications reworked. 2015-04-11 18:08:14 +00:00
.project All IRQ_STORM applications reworked. 2015-04-11 18:08:14 +00:00
Makefile Updated all makefiles by adding -Wundef. 2015-06-13 10:24:42 +00:00
chconf.h Fixed a formatting error in chconf.h. 2015-04-03 06:58:29 +00:00
halconf.h DAC off by default. 2015-05-03 09:25:35 +00:00
main.c All IRQ_STORM applications reworked. 2015-04-11 18:08:14 +00:00
mcuconf.h Aligned mcuconf.h files for STM32F0xx devices. Removed obsolete settings, added DMA remapping settings. 2015-07-29 08:59:55 +00:00
readme.txt git-svn-id: svn://svn.code.sf.net/p/chibios/svn/trunk@7650 35acf78f-673a-0410-8e92-d51de3d6d3f4 2015-02-01 10:50:37 +00:00

readme.txt

*****************************************************************************
** ChibiOS/HAL - IRQ_STORM stress test demo for STM32F0xx.                 **
*****************************************************************************

** TARGET **

The demo will on an STMicroelectronics STM32F0-Discovery board.

** The Demo **

The application demonstrates the use of the STM32F0xx GPT, PAL and Serial
drivers in order to implement a system stress demo.

** Board Setup **

None.

** Build Procedure **

The demo has been tested using the free Codesourcery GCC-based toolchain
and YAGARTO.
Just modify the TRGT line in the makefile in order to use different GCC ports.

** Notes **

Some files used by the demo are not part of ChibiOS/RT but are copyright of
ST Microelectronics and are licensed under a different license.
Also note that not all the files present in the ST library are distributed
with ChibiOS/RT, you can find the whole library on the ST web site:

                             http://www.st.com