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Remove some test code that was accidentally commited in 

c6f5b98a79
This commit is contained in:
Dominic Clifton 2015-09-19 14:23:50 +01:00
parent a9c775b03d
commit 0d391eccc4
1 changed files with 1 additions and 3 deletions
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4
src/main/drivers/accgyro_mpu6050.c
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@ -439,10 +439,8 @@ static void mpu6050GyroInit(void)
// Accel scale 8g (4096 LSB/g)
ack = i2cWrite(MPU6050_ADDRESS, MPU_RA_ACCEL_CONFIG, INV_FSR_8G << 3);
// ack = i2cWrite(MPU6050_ADDRESS, MPU_RA_INT_PIN_CFG,
// 0 << 7 | 0 << 6 | 0 << 5 | 0 << 4 | 0 << 3 | 0 << 2 | 1 << 1 | 0 << 0); // INT_PIN_CFG -- INT_LEVEL_HIGH, INT_OPEN_DIS, LATCH_INT_DIS, INT_RD_CLEAR_DIS, FSYNC_INT_LEVEL_HIGH, FSYNC_INT_DIS, I2C_BYPASS_EN, CLOCK_DIS
ack = i2cWrite(MPU6050_ADDRESS, MPU_RA_INT_PIN_CFG,
0 << 7 | 0 << 6 | 0 << 5 | 0 << 4 | 0 << 3 | 0 << 2 | 0 << 1 | 0 << 0); // INT_PIN_CFG -- INT_LEVEL_HIGH, INT_OPEN_DIS, LATCH_INT_DIS, INT_RD_CLEAR_DIS, FSYNC_INT_LEVEL_HIGH, FSYNC_INT_DIS, I2C_BYPASS_EN, CLOCK_DIS
0 << 7 | 0 << 6 | 0 << 5 | 0 << 4 | 0 << 3 | 0 << 2 | 1 << 1 | 0 << 0); // INT_PIN_CFG -- INT_LEVEL_HIGH, INT_OPEN_DIS, LATCH_INT_DIS, INT_RD_CLEAR_DIS, FSYNC_INT_LEVEL_HIGH, FSYNC_INT_DIS, I2C_BYPASS_EN, CLOCK_DIS
#ifdef USE_MPU_DATA_READY_SIGNAL
ack = i2cWrite(MPU6050_ADDRESS, MPU_RA_INT_ENABLE, MPU_RF_DATA_RDY_EN);