is gen_config invoked too often now? #2387
This commit is contained in:
parent
efeb3d9289
commit
7fb8d7f883
|
@ -9,7 +9,7 @@ rm -f gen_config_board.log
|
|||
bash gen_config_default.sh
|
||||
[ $? -eq 0 ] || { echo "ERROR generating default"; exit 1; }
|
||||
|
||||
for BOARD in "hellen/hellen72 hellen72" "microrusefi mre_f7" "microrusefi mre_f4" "frankenso frankenso_na6" "prometheus prometheus_469" "prometheus prometheus_405" "proteus proteus_f7" "proteus proteus_f4" "subaru_eg33 subaru_eg33_f7"; do
|
||||
for BOARD in "hellen/hellen72 hellen72" "microrusefi mre_f7" "microrusefi mre_f4" "frankenso frankenso_na6" "prometheus prometheus_469" "prometheus prometheus_405" "proteus proteus_f7" "proteus proteus_f4"; do
|
||||
BOARD_NAME="${BOARD% *}"
|
||||
BOARD_SHORT_NAME="${BOARD#* }"
|
||||
bash gen_config_board.sh $BOARD_NAME $BOARD_SHORT_NAME
|
||||
|
|
|
@ -1424,8 +1424,7 @@ float tChargeAirDecrLimit;;"tChange Decrement Limit (deg/sec)", 1, 0,
|
|||
#define tChargeMode_e_enum "RPM+TPS (Default)", "Air Mass Interpolation"
|
||||
custom tChargeMode_e 4 bits, U32, @OFFSET@, [0:0], @@tChargeMode_e_enum@@
|
||||
tChargeMode_e tChargeMode;
|
||||
|
||||
|
||||
|
||||
float[ETB_BIAS_CURVE_LENGTH] etbBiasBins;target TPS value, 0 to 100%\nTODO: use int8 data date once we template interpolation method;"target TPS position", 1, 0.0, 0, 100.0, 0
|
||||
float[ETB_BIAS_CURVE_LENGTH] etbBiasValues;PWM bias, 0 to 100%;"ETB duty cycle bias", 1, 0.0, -100, 100.0, 2
|
||||
|
||||
|
@ -1440,7 +1439,6 @@ tChargeMode_e tChargeMode;
|
|||
int16_t idleTimingPidDeadZone;+If the RPM closer to target than this value, disable timing correction to prevent oscillation;"RPM", 1, 0, 0, 1000, 0
|
||||
uint8_t[2] unused3942;;"units", 1, 0, -20, 100, 0
|
||||
|
||||
|
||||
int16_t tpsAccelFractionPeriod;+A delay in cycles between fuel-enrich. portions;"cycles", 1, 0, 0, 500, 0
|
||||
float tpsAccelFractionDivisor;+A fraction divisor: 1 or less = entire portion at once, or split into diminishing fractions;"coef", 1, 0, 0, 100, 2
|
||||
|
||||
|
|
Loading…
Reference in New Issue