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Update selector columns in expected-failure tests 

The addition of the non-identity selector caused the layouter to reorder
some of the selectors in the ECC gadget test circuit.
This commit is contained in:
Jack Grigg 2021-09-28 21:49:06 +01:00
parent d77cb82c8d
commit 631182fb77
1 changed files with 3 additions and 3 deletions
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6
src/circuit/gadget/ecc/chip/mul_fixed/short.rs
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@ -505,7 +505,7 @@ pub mod tests {
Err(vec![ Err(vec![
VerifyFailure::ConstraintNotSatisfied { VerifyFailure::ConstraintNotSatisfied {
constraint: ( constraint: (
(16, "Short fixed-base mul gate").into(), (17, "Short fixed-base mul gate").into(),
0, 0,
"last_window_check" "last_window_check"
) )
@ -537,13 +537,13 @@ pub mod tests {
prover.verify(), prover.verify(),
Err(vec![ Err(vec![
VerifyFailure::ConstraintNotSatisfied { VerifyFailure::ConstraintNotSatisfied {
constraint: ((16, "Short fixed-base mul gate").into(), 1, "sign_check") constraint: ((17, "Short fixed-base mul gate").into(), 1, "sign_check")
.into(), .into(),
row: 26 row: 26
}, },
VerifyFailure::ConstraintNotSatisfied { VerifyFailure::ConstraintNotSatisfied {
constraint: ( constraint: (
(16, "Short fixed-base mul gate").into(), (17, "Short fixed-base mul gate").into(),
3, 3,
"negation_check" "negation_check"
) )